Atomic Force Microscope (AFM)
AFM is a tool used to study surface morphology of a sample by scanning across the sample surface with its sharp micromanufactured tip attached to the cantilever. The image of surface is produced by the laser and photodiode, during the deflection on cantilever due to the force created between the interaction of tip and sample. AFMis usedto characterize thin films and coatings of nanomaterials including ceramics, metals, oxides, and polymers. Properties that can be measured by AFM are surface roughness, uniformity,morphology, mechanical properties, hardness, wear,conductivity, permittivity, stored charge, electrical properties, piezoelectric/electromechanical response, magnetic and thermal properties.
We provide sample characterization service
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Email address: laboratory.equipment.manager(a)gmail.com