Instrumentation@i-CRIM
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STATUS AVAILABILITY | CODE | INSTRUMENT | LOCATION | TYPE OF ANALYSIS | UKM | NON-UKM | LEAD TIME (DAY) | MORE INFORMATION |
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#PUKAL | PUKAL | Bulk Payment | Bulk Payment for any instruments.Please read the terms and conditions. Click Here | Any amount. | Any amount. | Please refer to the i-CRIM Request Form | ||
Available | AFM 01 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Topography (AFM) (contact /semi contact/non-contact) (1 quality image). Thickness of sample. | RM100/sample | RM240/sample | 7 | View Details |
Available | AFM 02 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Topography (STM) (Scanning Tunnelling Microscope) (1 quality image) | RM110/sample | RM250/sample | 0 | View Details |
Available | AFM 03 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Electrical Properties / Kelvin Probe (KPM) / Conductive AFM (CP-AFM) / Electrical Force Microscope (EFM)) (1 quality image) | RM130/sample | RM280/sample | 0 | View Details |
Available | AFM 03 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Magnetic Properties (Magnetic Force (MFM) (1 quality image) | RM130/sample | RM280/sample | 0 | View Details |
Available | AFM 03 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Mechanical Properties (Force Modulation (FMM) (1 quality image) | RM130/sample | RM280/sample | 0 | View Details |
Available | AFM 03 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Piezoresponse Force (PFM) / Lithography/Pinpoint (adhesion force, modules, stiffness) (1 quality image) | RM130/sample | RM280/sample | 0 | View Details |
Available | AFM 05 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Force Measurement (Force Spectroscopy) (5 spots) | RM70/sample | RM200/sample | 0 | View Details |
Available | AFM 06 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Scanning Thermal Microscope (ShTM) (1 quality image) | RM180/sample | RM280/analysis | 3 | View Details |
Available | AFM 07 | Atomic Force Microscope (AFM) | Level 3, i-CRIM Centralised Lab, Research Complex UKM | Additional scan (1 quality image) | RM50/sample | RM70/sample | 0 | View Details |
INSTRUMENT | TYPE OF ANALYSIS |
Showing 1 to 10 of 78 entries
Updated on September 2024
Showing all 27 resultsSorted by latest
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Atomic Force Microscope (AFM)
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Automatic Polarimeter (POL)
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Capillary Electrophoresis Mass Spectrometry (CE-MS)
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Centrifugal Partition Chromatography (CPC)
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CHNS/O Elemental Analyzer (CHNS/O)
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Differential Scanning Calorimeter (DSC)
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Field Emission Scanning Electron Microscope (FESEM) – MERLIN
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Field Emission Scanning Electron Microscope (FESEM) – Merlin Compact
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Field Emission Scanning Electron Microscope (FESEM) – Supra 55VP
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Fourier Transform Infrared Spectrometer (FT-IR)
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Fourier Transform Nuclear Magnetic Resonance (FT-NMR) 400 MHz
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Fourier Transform Nuclear Magnetic Resonance (FT-NMR) 600 MHz with Cryoprobe
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Gas Chromatography Mass Spectrometer (GC-MS)
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High-Performance Liquid Chromatography Spectrometer (HPLC)
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Inductively Coupled Plasma Mass Spectrometer (ICP-MS)
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Laser Particle Size Analyzer (LPSA)
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Nano Particle Size Analyzer (NPSA)
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Photoluminescence Spectrometer (PL)
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Platinum/Iridium/Gold Sputter Coater
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Raman Spectrometer (RAMAN)
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Simultaneous Thermal Analyzer (STA)
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Single Crystal X-Ray Diffractometer (SC-XRD)
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Transmission Electron Microscope (TEM)
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Ultraviolet/Visible/Near Infrared Spectrometer (UV-VIS-NIR)
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X-Ray Diffractometer (XRD)
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X-Ray Fluorescence Spectrometer (XRF)
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X-Ray Photoelectron Spectrometer (XPS)
To get a quotation, please email your complete Request Form to crimlab@ukm.edu.my.