Solar Energy Research Institute
High Precision 4 Point Probe
The tester is suitable for the use in the testing of the sheet resistance and resistivity of ITO coated glass, FTO coated glass, AZO coated glass, and other conductive thin film that with uniform and rigid structure.
Technical Specifications of the Tester
1) Testing resistance range:1O µO – 2.00 kO (Five testing resistance range with different testing current)
2) With the function of sorting,is suitable for the use in commercial manufacture.
3) The type ofFour-Point Probe: linear four probe.
4) The Material of the Four-Point Probe: tungsten carbide .
5) The distance between two neighboring probes :1mm
6) The deviation of the distance between two neighboring probes: <2 %
7) The resultant force of the Four-Point Probe: 4•1N
8) The diameter of the Indentation of the Four-Point Probe: 200-400 µm
9) The mechanical shift rate of the Four-Point Probe: <0.3 %
10) The max space between the guide hole and the Four-Point Probe: 0.006mm
11) The insulation resistance of the Four-Point Probe at 500V :>1000 mo
12) The probes distance correction factor Fsp: Please find the value of Fsp from the testing result of the Four-Point Probe in the Table 4 in the Operation Manual.
Scanning Kelvin Probe
1. Tip material / diameter : Standard 2 mm gold tip (0.05 mm available on request)
2. Work function resolution : 1 – 3 meV
3. Sample scan size : 50 x 50 mm
4. 3D sample area : Square
5. Height control (auto) : 25mm
6. Visualisation : 3D map of surface potential
7. Optical system : Colour camera with zoom lens and monitor
8. Oscilloscope : Digital TFT oscilloscope for real time signal
9. Test sample : Gold and aluminium test sample
10. Faraday enclosure base : 450 x 450 mm
11. Control supplied : PC control with dedicated software for full control of all parameters
Detection system : Off-null with parasitic capacity rejection
Light -Induced-Current-Voltage
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